• PRODUCT
  • 전원 & 가속기 컴포넌트
전원 & 가속기 컴포넌트
  • TERX Detection System
    • 모델명 : TERX Detection System
    • 제조사 : DREEBIT
    • 원산지 : Germany
제품특징 제품사양 자료실      

Description

The TERX detection system is used to measure x-ray spectra at Electron Beam Ion Sources in dependence

on the ionisation time and in dependence on the electron energy.

The system needs to be combined with an x-ray detector. An appropriate detector is listed as optional

equipment in the table at the end of this document.

It is possible to use a customer-specific detector if certain requirements are fulfilled,

see table of technical parameters.

 

Functional Principle

The TERX Detection System controls the source potential and trap cycle of the ion source.

The x-ray events are counted directly from the X-ray detector and sorted in a time or energy matrix.

Figure 1 - time resolved measurement scheme

Figure 1 - time resolved measurement scheme

 

Figure 2 - time resolved measurement example

Figure 2 - time resolved measurement example

 

In time resolved measurement mode, the ion trap is controlled by the TERX system while

the x-ray detector analyzes the incoming x-ray events and gives the x-ray energy information

to a 12 pin output connector. The TERX system sorts the signal into a time-energy matrix.

This matrix is sent to the control PC.

A summary of the functional principle of this measurement mode is shown in Figure 1.

The minimum possible time resolution of the measurement system is 1 ms.

An example for a time resolved x-ray measurement is given in Figure 2.

The energy resolved x-ray measurement is done in a measurement loop, displayed in Figure 3.

The trap potential is set by the TERX system.

The trap potential is increased stepwise and in each measurement loop the X-ray events during

a trap cycle are stored and are labelled by the corresponding trap potential.

The minimal possible trap potential resolution depends on the accuracy of the drift tube potential unit.

 

Figure 3 - electron beam energy resolved measurement scheme

Figure 3 - electron beam energy resolved measurement scheme

 

Figure 4 - electron beam energy resolved measurement example

Figure 4 - electron beam energy resolved measurement example

 

As an example for the (electron beam) energy resolved measurement mode, a measurement of the

dielectronic recombination (DR) and radiative recombination (RR) lines of Krypton ions is shown in Figure 4.

The data was recorded with the provided data acquisition software. With this software,

the data can be processed, used to create graphs, and saved for further applications. 

제품특징 제품사양 자료실      

Parameters

 

 TERX System Parameters

 minimum time resolution

 1 ms

 maximum x-ray detector resolution

 12 bit

 maximum electron beam energy resolution

 16 bit

 maximum count rate

 10000 cps



 Requirements for Detector Attachment

 detector interface

 signal type 5 V TTL

 output channels

 'Strobe' - incomming x-ray signal

 

 'High Load' - more x-ray signals arrive before

 first signal is read-out

 

 12 bit channel output of x-ray signals

 according to x-ray energy

 input channels

 'Clear 1' - clearing 'Strobe' and 12 bit x-ray

 output channels

 

 'Clear 2' - clearing the 'High Load' channel

  

 

DOWNLOAD ProductSheet_TERX.pdf